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The 17³Ô¹Ï TestMAX? family of products offers innovative, next-level test and diagnosis capabilities for all digital, memory and analog portions of a semiconductor device. The 17³Ô¹Ï TestMAX family contains unique capabilities for automotive test and functional safety as well as technologies that unlock new levels of test bandwidth and efficiency by leveraging high-speed interfaces common on many designs.
As part of the Silicon Lifecycle Management Family, 17³Ô¹Ï TestMAX offers a powerful and highly configurable test automation flow with seamless integration of all 17³Ô¹Ï TestMAX capabilities. Early validation of complex DFT logic is supported through full RTL integration while maintaining physical, timing and power awareness through direct links into the 17³Ô¹Ï Digital Design Family. These new features, combined with comprehensive support for early testability analysis and planning, hierarchical ATPG compression, physically-aware diagnosis, logic BIST, memory self-test and repair and analog fault simulation, ensure the 17³Ô¹Ï TestMAX product family addresses critical test issues and enables effective test for the most demanding applications.
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Resources
Webinar
Making the Right Connections: Taking the Guess Work out of DFT Connectivity Validation
Success Story
STMicroelectronics Successful Deployment of 17³Ô¹Ï Embedded Memories Diagnosis Flow for Advanced Technology Nodes
White Paper
17³Ô¹Ï TestMAX Advisor: Accelerating Shift Left with Early RTL Analysis and Optimization
